Post-seal inspection system and method
Номер патента: WO2001004604B1
Опубликовано: 15-02-2001
Автор(ы): Tay Bok Her
Принадлежит: Semiconductor Tech & Instr Inc, Tay Bok Her
Опубликовано: 15-02-2001
Автор(ы): Tay Bok Her
Принадлежит: Semiconductor Tech & Instr Inc, Tay Bok Her
Реферат: A system (100) for inspection components that are sealed within tape (102) is provided. The system (100) includes a light source (100) that can illuminate the components through a tape layer (102). A polarizer (108) is used to polarize light from the light source (110), the components, and the tape layer (102), so as to reduce glare and reflected light. An image system (116) receives light from the polarizer (108) and stores image data for each component.
Post-seal inspection system and method
Номер патента: US20010028453A1. Автор: Tay Her. Владелец: Individual. Дата публикации: 2001-10-11.