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Resistive memory device and method for fabricating the same

Номер патента: US20190287611A1
Опубликовано: 19-09-2019
Автор(ы): Feng-Min Lee, Po-Hao Tseng
Принадлежит: Macronix International Co Ltd
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Paint thickness measuring device and computer-implemented method for measuring paint thickness

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Materials and methods for fabricating superconducting quantum integrated circuits

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Variable ICE and methods for measuring sample properties with the same

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Optical film and method of adjusting wavelength dispersion characteristics of the same

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Integral pressure vessel penetrations and systems and methods for using and fabricating the same

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Guidance seeking device for a satellite and method for enhancing the performance of the same

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Contour detection device and contour adjustment method for stainless steel composite corrugated plate

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Laser-based coordinate measuring device and laser-based method for measuring coordinates

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Display screen, electronic device and information processing method for the electronic device

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Composite quantum dot, method for preparing the same, and method for detecting metal ion using the same

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Device and respective control method for controlling the activities of a colony of insects

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Display device and backlight control method for display device

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Degradation diagnosis device and degradation diagnosis method for exhaust gas sensor

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Device and thread gauging method for ensuring spark plug orientation

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Deployment control device and deployment control method for deploying virtual machine for allowing access

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Apparatus for manufacturing display device and method for manufacturing display device using the same

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Risk monitoring device and risk monitoring method for use with nuclear power facility

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Glass former composition and method for immobilizing nuclear waste using the same

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Sensing device and sensing processing method for moving object and virtual golf simulation device using the same

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