Ultrasonic angle beam probe with mechanical lateral adjustment
Номер патента: EP3695220A1
Опубликовано: 19-08-2020
Автор(ы): Alexander Fiseni, Daniel Werner, Frank HENRIX, Joerg KRAHE
Принадлежит: General Electric Co
Опубликовано: 19-08-2020
Автор(ы): Alexander Fiseni, Daniel Werner, Frank HENRIX, Joerg KRAHE
Принадлежит: General Electric Co
Реферат: An inspection system can include a probe assembly comprising a first ultrasonic probe configured to generate an ultrasonic beam. The inspection system, can include a probe holder having a through channel and an outer contacting surface. The through channel can include a first region located at a proximal end of the probe holder. The first region can be configured to receive a distal end of the probe assembly. The probe assembly can be configured to rotate relative to the probe holder about an axis. The outer contacting surface can be located at a distal end of the probe holder and can be configured to removably couple to a target. The ultrasonic beam generated by the first ultrasonic probe can be configured to traverse a target volume in the target based on the rotation of the probe assembly.
Ultrasonic angle beam probe with mechanical lateral adjustment
Номер патента: WO2019074984A1. Автор: Daniel Werner,Alexander Fiseni,Frank HENRIX,Joerg KRAHE. Владелец: GENERAL ELECTRIC COMPANY. Дата публикации: 2019-04-18.