Ambient ionisation spot measurement and validation
Номер патента: EP3465731A1
Опубликовано: 10-04-2019
Автор(ы): Emrys Jones, Richard Chapman, Steven Pringle
Принадлежит: Micromass UK Ltd
Опубликовано: 10-04-2019
Автор(ы): Emrys Jones, Richard Chapman, Steven Pringle
Принадлежит: Micromass UK Ltd
Реферат: Apparatus is disclosed comprising a first ion source (210) arranged and adapted to emit a spray of charged droplets (211) and a detector or sensor (203) arranged and adapted automatically to detect, sense or determine one or more first parameters or properties of the spray of charged droplets (211) as the spray of charged droplets (211) impacts upon a surface of the detector or sensor 203. The apparatus further comprises a control system (204) arranged and adapted to adjust, correct and/or optimise one or more second parameters or properties of the spray of charged droplets (211) based on the one or more first parameters or properties of the spray of charged droplets (211) detected, sensed or determined by the detector or sensor (203).
Techniques for measuring and controlling ion beam angle and density uniformity
Номер патента: WO2009064871A3. Автор: Victor M Benveniste,Svetlana Radovanov,Frank Sinclair,John Slocum,Peter L Kellerman,Kenneth Purser. Владелец: Kenneth Purser. Дата публикации: 2009-07-02.