Method of testing semiconductor memory device, test device, and computer readable recording medium for recording test program for semiconductor memory device.

Method of testing semiconductor memory device, test device, and computer readable recording medium for recording test program for semiconductor memory device

Номер патента: US09666304B2
Опубликовано: 30-05-2017
Автор(ы): Sea Eun Park, Sung Hee Yun
Принадлежит: SAMSUNG ELECTRONICS CO LTD
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Рисунок 1. Взаимосвязь патентов (ближайшие 20).

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