APPARATUS AND METHOD FOR THE SYNTHESIS OF AN EXCITATION SIGNAL FOR THE ACTIVE TEST OF AN INTEGRATED CIRCUIT
Номер патента: FR2535552B1
Опубликовано: 06-06-1986
Автор(ы): David R Mccracken, Robin R Larson
Принадлежит: Tektronix Inc
Опубликовано: 06-06-1986
Автор(ы): David R Mccracken, Robin R Larson
Принадлежит: Tektronix Inc
Реферат: A special purpose pulse amplifier with programmable high and low levels for complex IC testing is disclosed. Its output has independently programmable positive and negative transition rates and is reverse terminated in 50 ohms. It also has the ability to be switched to a high resistance, low capacitance output state. This circuit is the interface between a complex, computer controlled system of timing and pattern generation hardware, and an integrated circuit to be tested. This device has reduced waveform aberrations, lower inhibited capacitance, low input to output delay for reducing timing error, programmable signal transition rates, and the amplitude range and transition rate control to accommodate all the important device technologies expected in high pin-count parts.
Circuit for and method of implementing a scan chain in programmable resources of an integrated circuit
Номер патента: US10069497B2. Автор: Rafael C. Camarota,Benjamin S. Devlin. Владелец: Xilinx Inc. Дата публикации: 2018-09-04.