A sample inspection system
Номер патента: EP3827250A1
Опубликовано: 02-06-2021
Автор(ы): Keith Rogers, Paul Evans
Принадлежит: Cranfield University, NOTTINGHAM TRENT UNIVERSITY
Опубликовано: 02-06-2021
Автор(ы): Keith Rogers, Paul Evans
Принадлежит: Cranfield University, NOTTINGHAM TRENT UNIVERSITY
Реферат: There is presented an apparatus (100) for identifying a sample.Such apparatus may for example be used to detect unwanted items as part of a security screening system.The apparatus (100) comprises a platform (110) for receiving the sample, at least one electromagnetic radiation emitter (130), a plurality of detectors (141-148) and a calculator. The electromagnetic radiation emitter (130) is adapted to provide a plurality of conical shells of radiation. Each conical shell has a characteristic propagation axis associated with it. The detectors (141-148) are arranged to detect radiation diffracted by the sample upon incidence of one or more conical shells of radiation. Each detector is located on the characteristic propagation axis associated with a corresponding conical shell.The calculator is adapted to calculate a parameter of the sample based on the detected diffracted radiation. The parameter comprises a lattice spacing of the sample.
A sample inspection system
Номер патента: GB2577856A. Автор: EVANS Paul,Rogers Keith. Владелец: NOTTINGHAM TRENT UNIVERSITY. Дата публикации: 2020-04-15.