Optical system for measuring dimensions of objects
Реферат: ABSTRACT OF THE DISCLOSURE A microscope-projector system is employed to image and view a transistion of light and dark on an object. The position of the shadow corresponds to the vertical position of a portion of the object, and an adjustable device is employed for adjusting the position of the microscope-projector with respect to the object. A video camera may be connected to the microscope, to project the image on a monitor. Vertical adjustment of the microscope-projector assembly enables measurement of thickness, for example, with respect ot a reference level. The scan lines of the video camera may also be employed to locate the position of the shadow to indicate the thick-ness of the object, and also to automatically readjust the position of the shadow to reference level. Electronic circuitry may also play a part to determine from transition in scan lines the horizontal dimensions of an object.
OPTICAL SYSTEM AND METHOD FOR MEASUREMENT OF ONE OR MORE PARAMETERS OF VIA-HOLES
Номер патента: US20140376006A1. Автор: SCHEINER David. Владелец: NOVA MEASURING INSTRUMENTS LTD.. Дата публикации: 2014-12-25.