Circuit for testing and analyzing tsv and method of testing the same.

Circuit for testing and analyzing tsv and method of testing the same

Номер патента: US20170269150A1
Опубликовано: 21-09-2017
Автор(ы): Sung Ho Kang, Young Woo Lee
Принадлежит: Industry Academic Cooperation Foundation of Yonsei University
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Рисунок 1. Взаимосвязь патентов (ближайшие 20).

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