Autonomous hybrid analytics modeling platform
Номер патента: EP3743826A1
Опубликовано: 02-12-2020
Автор(ы): Alexandre N. IANKOULSKI, Arun Karthi SUBRAMANIYAN, Fábio Nonato de Paula, Renato GIORGIANI DO NASCIMENTO, Shyam Sivaramakrishnan
Принадлежит: GE Inspection Technologies LP
Опубликовано: 02-12-2020
Автор(ы): Alexandre N. IANKOULSKI, Arun Karthi SUBRAMANIYAN, Fábio Nonato de Paula, Renato GIORGIANI DO NASCIMENTO, Shyam Sivaramakrishnan
Принадлежит: GE Inspection Technologies LP
Реферат: In some embodiments, a selection of one or more data tags of a dataset can be received via a graphical user interface (GUI). The data tags can correspond to data in the dataset, and the data can include training data and testing data. A selection of one or more analytics model building techniques can also be received via the GUI. Then, a data processor can build plurality of analytics models using the training data. Each of the one or more selected analytics model building techniques can be used to build at least one analytics model. After building the plurality of analytics models, the data processor can calculate a performance of each of the plurality of analytics models using the testing data. Based on the calculated performance of each of the plurality of analytics models, the GUI can display a comparison of each of the plurality of analytics models.
Autonomous hybrid analytics modeling platform
Номер патента: SG11202007064YA. Автор: Do NASCIMENTO Renato Giorgiani,Shyam Sivaramakrishnan,Arun Subramaniyan,Alexandre IANKOULSKI,De Paula Fabio Nonato. Владелец: GE Inspection Technologies LP. Дата публикации: 2020-08-28.