METHOD AND DEVICE FOR COMPENSATION OF VARIATIONS IN THE CHARACTERISTICS OF INFORMATION PROCESSING CHANNELS
Номер патента: FR2289018A1
Опубликовано: 21-05-1976
Автор(ы):
Принадлежит: Stanford Research Institute
Опубликовано: 21-05-1976
Автор(ы):
Принадлежит: Stanford Research Institute
Quality measuring method and quality measuring device for long sheet material
Номер патента: CA3101951A1. Автор: Hisataka Shitara. Владелец: Psm International Inc. Дата публикации: 2019-12-05.