Method of forming transition metal dichalcogenidethin film and method of manufacturing electronic device including the same
30-01-2024 дата публикации
Номер:
US0011887849B2
Принадлежит: Samsung Electronics Co., Ltd., Research & Business Foundation, Sungkyunkwan University, Research & Business Foundation Sungkyunkwan University
Контакты:
Номер заявки: 61-26-1701
Дата заявки: 04-09-2020







CPC - классификация
CC2C23C23CC23C1C23C14C23C14/C23C14/0C23C14/06C23C14/062C23C14/0623C23C14/3C23C14/34C23C14/5C23C14/54C23C14/541C23C14/58C23C14/580C23C14/5806C23C14/586C23C14/5866HH0H01H01LH01L2H01L21H01L21/H01L21/0H01L21/02H01L21/022H01L21/0220H01L21/02205H01L21/024H01L21/0248H01L21/02485H01L21/025H01L21/0250H01L21/02505H01L21/0256H01L21/02568H01L21/0259H01L21/02592H01L21/02595H01L21/026H01L21/0263H01L21/02631H01L21/0266H01L21/02667H01L21/2H01L21/28H01L21/281H01L21/2819H01L21/28194H01L21/285H01L21/2856H01L21/28568H01L21/3H01L21/32H01L21/324H01L29H01L29/H01L29/2H01L29/24H01L29/6H01L29/66H01L29/669H01L29/6696H01L29/66969H01L29/7H01L29/77H01L29/778H01L29/78H01L29/786H01L29/7868H01L29/78681H01L29/7869H01L29/78696IPC - классификация
CC2C23C23CC23C1C23C14C23C14/C23C14/0C23C14/06C23C14/3C23C14/34C23C14/5C23C14/58HH0H01H01LH01L2H01L21H01L21/H01L21/0H01L21/02H01L21/026H01L21/0263H01L21/02631H01L21/3H01L21/32H01L29H01L29/H01L29/6H01L29/66H01L29/7H01L29/78H01L29/786H01L29/7869Цитирование НПИ
Chiappe et al. “Layer-controlled Epitaxy of 2D Semiconductors: Bridging Nanoscale Phenomena to Wafer-Scale Uniformity”, Nano technology 29, 425602 (2018).Dolui et al. “Possible doping strategies for MoS2 monolayers: An ab initio study” 2013, Phys. Rev. B 88 075420 (Year: 2013).
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Huang et al. “Large-area few-layer MoS2 deposited by sputtering” 2016, Mater. Res. Express, vol. 3, 065007 and Supplementary Information (Year: 2016).
Huang et al. “Large-area few-layer MoS2 deposited by sputtering”, Mater. Res. Express, vol. 3, (2016) 065007.
Nitin Choudhary et atl., “Groth of Large-Scale and Thinkness-Modulated MoS2 Nanosheets” Applied Materials & Interfaces, 2014.
Ramos et al. “Mechanical Properties of RF-sputtering MoS2 Thin Films”, Surf. Topogr.: metrol. prop. 5 (2017) 025003.
Supplementary Information of Huang et al. (Year: 2016).
Yin et al. “Direct Formation of 2-dimensional Molybdenum Disulfide Thin Films by RF Sputtering and Rapid Thermal Annealing on Sapphire Substrate”, Journal of semiconductor technology and science, vol. 18 No. 2, 2018. 4, pp. 153-159.