Protocol independent testing of memory devices using a loopback
Номер патента: EP3824390A1
Опубликовано: 26-05-2021
Автор(ы): Michael B. Danielson, Patrick CARAHER
Принадлежит: Micron Technology Inc
Опубликовано: 26-05-2021
Автор(ы): Michael B. Danielson, Patrick CARAHER
Принадлежит: Micron Technology Inc
Реферат: A device under test for performing built-in self-tests to determine the functionality of one or more components of the device under test is described. The device under test includes a storage location to store a set of tests for testing the device under test; a data generator to generate a test pattern based on a test in the set of tests; a transmission unit to transmit the test pattern to a test system; a receiver unit to receive a set of loopback signals from the test system, wherein the set of loopback signals represent the test pattern; and a data checker to determine success or failure of the device under test based on the set of loopback signals.
Peak power management connectivity check in a memory device
Номер патента: US11990197B2. Автор: Massimo Rossini,Eleuterio Mannella. Владелец: Micron Technology Inc. Дата публикации: 2024-05-21.